Results of search for 'su:"Scanning probe microscopy"'

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	1.	Applied Scanning Probe Methods. III [electronic resource] : Characterization / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: NanoScience and Technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	2.	Applied Scanning Probe Methods. IV [electronic resource] : Industrial Applications / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: NanoScience and Technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	3.	Applied Scanning Probe Methods. X [electronic resource] : Biomimetics and Industrial Applications / edited by Bharat Bhushan, Masahiko Tomitori, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald Tomitori, Masahiko SpringerLink (Online service) Series: Nano Science and Technolgy Publication details: Berlin, Heidelberg : Springer-Verlag, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	4.	Applied Scanning Probe Methods. IX [electronic resource] : Characterization / edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. by Tomitori, Masahiko Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: Nano Science and Technolgy Publication details: Berlin, Heidelberg : Springer-Verlag, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	5.	Applied Scanning Probe Methods. VIII [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. by Bhushan, Bharat Fuchs, Harald Tomitori, Masahiko SpringerLink (Online service) Series: Nano Science and Technolgy Publication details: Berlin, Heidelberg : Springer-Verlag, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	6.	Applied Scanning Probe Methods V : Scanning Probe Microscopy Techniques [electronic resource] / edited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs. by Bhushan, Bharat Kawata, Satoshi Fuchs, Harald SpringerLink (Online service) Series: NanoScience and Technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	7.	Applied Scanning Probe Methods VI : Characterization [electronic resource] / edited by Bharat Bhushan, Satoshi Kawata. by Bhushan, Bharat Kawata, Satoshi SpringerLink (Online service) Series: NanoScience and Technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	8.	Applied Scanning Probe Methods VII : Biomimetics and Industrial Applications [electronic resource] / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: NanoScience and Technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	9.	Applied scanning probe methods XI [electronic resource] : scanning probe microscopy techniques / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: Nanoscience and technology Publication details: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	10.	Applied scanning probe methods XII [electronic resource] : characterization / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: Nanoscience and technology Publication details: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	11.	Applied scanning probe methods XIII [electronic resource] : biomimetics and industrial applications / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat Fuchs, Harald SpringerLink (Online service) Series: Nanoscience and technology Publication details: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	12.	Force microscopy : applications in biology and medicine / edited by Bhanu P. Jena, J.K. Heinrich Horber by Jena, Bhanu P Horber, J. K. Heinrich Publication details: Hoboken, N.J. : Wiley-Liss, 2006 Online resources: Publisher description Table of contents only Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: R856.A2F677. Place hold
	13.	Nanoscale processes on insulating surfaces / Enrico Gnecco, Marek Szymonski. by Gnecco, Enrico Szymonski, Marek Publication details: Hackensack, NJ : World Scientific, 2009 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: QH212.S33G543 3. Place hold
	14.	Roadmap of Scanning Probe Microscopy [electronic resource] / edited by Seizo Morita. by Morita, Seizo SpringerLink (Online service) Series: NanoScience and Technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	15.	Scanning probe microscopes : applications in science and technology / K.S. Birdi by Birdi, K. S, 1934- Publication details: Boca Raton, Florida : CRC, 2003 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QH212.S33B57. Place hold
	16.	Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer. by Foster, Adam Hofer, Werner SpringerLink (Online service) Series: NanoScience and Technology Publication details: New York, NY : Springer Science+Business Media, LLC, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	17.	Scanning Probe Microscopy [electronic resource] : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman. by Kalinin, Sergei Gruverman, Alexei SpringerLink (Online service) Publication details: New York, NY : Springer Science+Business Media, LLC, 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	18.	Scanning probe microscopy and spectroscopy : theory , thechniques, and applications / edited by Dawn Bonnell by Bonnell, Dawn Edition: 2nd ed. Publication details: New York : John Wiley & Sons Inc, 2001 Availability: Items available for loan: PERPUSTAKAAN DR ABDUL LATIFF (1)Call number: QH212.S283 2001 9. Place hold
	19.	Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon. by Yablon, Dalia G, 1975- Publisher: Hoboken, New Jersey : John Wiley & Sons,, [2013] Online resources: Cover image Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TA417.23.S334 3. Place hold
	20.	Scanning probe microscopy in nanoscience and nanotechnology [electronic resource] / edited by Bharat Bhushan. by Bhushan, Bharat SpringerLink (Online service) Series: Nanoscience and technology Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2010 In: Springer eBooks Online resources: Click here to access online Availability: No items available.

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