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Applied Scanning Probe Methods. IX [electronic resource] : Characterization / edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs.

Contributor(s): Series: Nano Science and TechnolgyPublication details: Berlin, Heidelberg : Springer-Verlag, 2008.Description: 387 p. : ill., digital ; 24 cmISBN:
  • 9783540740834 (electronic bk.)
  • 9783540740827 (paper)
Subject(s): DDC classification:
  • 502.82 22
LOC classification:
  • TA417.23 .A655 2008
Online resources: In: Springer eBooks
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