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Applied Scanning Probe Methods. Characterization / IX

Applied Scanning Probe Methods. Characterization / IX [electronic resource] : edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. - Berlin, Heidelberg : Springer-Verlag, 2008. - 387 p. : ill., digital ; 24 cm. - Nano Science and Technolgy, 1434-4904 .

ISBN: 9783540740834 (electronic bk.) 9783540740827 (paper)

Subjects--Topical Terms:
Scanning probe microscopy.
Materials--Microscopy.
Chemistry.
Nanotechnology.
Physical Chemistry.
Polymer Sciences.
Solid State Physics and Spectroscopy.
Surfaces and Interfaces, Thin Films.

LC Class. No.: TA417.23 / .A655 2008

Dewey Class. No.: 502.82

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Applied Scanning Probe Methods. Characterization / IX

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