Your search returned 2 results.

Results
	1.	No cover image available Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr by Murr, Lawrence E. (Lawrence Eugene) Series: Optical engineering ; v. 1 Publication details: New York : Marcel Dekker, 1982 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QH212.E4M87. Place hold
	2.	Field emission and related topics : Erwin W. Muller Festchrift volume / guest editors : Paul H. Cutler and Tien T. Tsong by Muller, Erwin W Cutler, Paul H Tsong, Tient T Publication details: Amsterdam : North-Holland, 1978 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC700.F53. Place hold

Refine your search