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Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr

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Series: Optical engineering ; v. 1Publication details: New York : Marcel Dekker, 1982Description: 793 p. : ill. ; 26 cmSubject(s):

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	QH212.E4M87 (Browse shelf(Opens below))		1	Available		00000081812

Includes bibliographical references and indexes

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