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Electron and ion microscopy and microanalysis : principles and applications /

Murr, Lawrence E.

Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr - New York : Marcel Dekker, 1982 - 793 p. : ill. ; 26 cm. - Optical engineering ; v. 1 .

Includes bibliographical references and indexes

Subjects--Topical Terms:
Electron microscopy
Field ion microscope
Microprobe analysis

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Electron and ion microscopy and microanalysis : principles and applications /

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