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Digital Noise Monitoring of Defect Origin [electronic resource] / by Telman Aliev.
Publication details: Boston, MA : Springer Science+Business Media, LLC, 2007.Description: xii, 223 p. : ill., digital ; 24 cmISBN:- 9780387717548 (electronic bk.)
- 621.38224 22
- TK7867.5 .A45 2007
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