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Digital Noise Monitoring of Defect Origin

Aliev, Telman.

Digital Noise Monitoring of Defect Origin [electronic resource] / by Telman Aliev. - Boston, MA : Springer Science+Business Media, LLC, 2007. - xii, 223 p. : ill., digital ; 24 cm.

ISBN: 9780387717548 (electronic bk.)

Subjects--Topical Terms:
Electronic noise--Mathematical models.
Information storage and retrieval systems--Materials--Defects.
Signal detection.
Defect correction methods (Numerical analysis)

LC Class. No.: TK7867.5 / .A45 2007

Dewey Class. No.: 621.38224

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Digital Noise Monitoring of Defect Origin

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