Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang.

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Publication details: Boston, Mass. : Kluwer Academic Publishers, 1993.Description: 212 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	TK7874.L334 (Browse shelf(Opens below))		1	Available		00000814271

Includes index.

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