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Hot-carrier reliability of MOS VLSI circuits /

Leblebici, Yusuf.

Hot-carrier reliability of MOS VLSI circuits / by Yusuf Leblebici, Sung-Mo (Steve) Kang. - Boston, Mass. : Kluwer Academic Publishers, 1993. - 212 p. : ill. ; 24 cm.

Includes index.

ISBN: 079239352X RM325.95

LCCN: 93-15447

Subjects--Topical Terms:
Integrated circuits--Very large scale integrated--Defects--Mathematical models.
Metal oxide semiconductors--Reliability--Mathematical models.
Hot--carriers--Reliability--Mathematical models.

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