Amazon cover image
Image from Amazon.com

Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer.

By: Contributor(s): Publication details: Boston, MA : Springer Science+Business Media, Inc., 2007.Description: 1online resource(xiv, 336 p.) : ill., digital ; 25 cmISBN:
  • 9780387292618 (electronic bk.)
Subject(s): DDC classification:
  • 621.38152 22
Online resources: In: Springer e-books
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

There are no comments on this title.

to post a comment.

Contact Us

Perpustakaan Tun Seri Lanang, Universiti Kebangsaan Malaysia
43600 Bangi, Selangor Darul Ehsan,Malaysia
+603-89213446 – Consultation Services
019-2045652 – Telegram/Whatsapp
Email: helpdeskptsl@ukm.edu.my

Copyright ©The National University of Malaysia Library