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Fundamentals of Nanoscale Film Analysis

Alford, Terry L.

Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer. - Boston, MA : Springer Science+Business Media, Inc., 2007. - 1online resource(xiv, 336 p.) : ill., digital ; 25 cm.

ISBN: 9780387292618 (electronic bk.)

Subjects--Topical Terms:
Thin films.
Nanostructured materials.

Dewey Class. No.: 621.38152

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