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Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe.

By: Contributor(s): Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008.Edition: Third EditionDescription: xix, 758 p. : ill., digital ; 24 cmISBN:
  • 9783540738862 (electronic bk.)
  • 9783540738855 (paper)
Subject(s): DDC classification:
  • 620.11299 22
LOC classification:
  • TA417.23 .F85 2008
Online resources: In: Springer e-books
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