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Transmission Electron Microscopy and Diffractometry of Materials

Fultz, Brent.

Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe. - Third Edition. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008. - xix, 758 p. : ill., digital ; 24 cm.

ISBN: 9783540738862 (electronic bk.) 9783540738855 (paper)

Subjects--Topical Terms:
Materials--Microscopy.
Transmission electron microscopy.
Chemistry.
Characterization and Evaluation of Materials.
Crystallography.
Physics and Applied Physics in Engineering.
Solid State Physics and Spectroscopy.
Surfaces and Interfaces, Thin Films.

LC Class. No.: TA417.23 / .F85 2008

Dewey Class. No.: 620.11299

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Transmission Electron Microscopy and Diffractometry of Materials

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