Yield modelling and defect tolerance in VLSI papers presented at the International Workshop on Designing for Yield, Oxford 1-3 July 1987 edited by Will Moore, Wojciech Maly and Andrzej Strojwas

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Publication details: Bristol Adam Hilger 1987Description: vi, 282 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	TK7870.Y54 (Browse shelf(Opens below))		1	Available		00000313113

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