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Reliability and degradation semiconductor devices and circuits/ edited by M.J.Howes, D.V.Morgan.
Series: The Wiley series in solid state devices and circuitsPublication details: Chichester: John Wiley & Sons, 1981.Description: 444p.; 23 cmISBN:- 0471280283
| Item type | Current library | Home library | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | TK7871.85.R44 (Browse shelf(Opens below)) | 1 | Available | 00000314777 | |||
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | TK7871.85.R44 (Browse shelf(Opens below)) | 1 | Available | 00000147636 |
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