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Reliability and degradation semiconductor devices and circuits/

Reliability and degradation semiconductor devices and circuits/ edited by M.J.Howes, D.V.Morgan. - Chichester: John Wiley & Sons, 1981. - 444p.; 23 cm. - The Wiley series in solid state devices and circuits. .

ISBN: 0471280283

Subjects--Topical Terms:
Semiconductors--Reliability.

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Reliability and degradation semiconductor devices and circuits/

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