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New algorithms for fault simulation and random pattern testing [microform] / by Vinod Narayanan.

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Publication details: Ann Arbor, Mich. : University Microfilms International, 1989.Description: 2 microfiches ; 11 X 15 cmSubject(s):

Dissertation note: Thesis (Ph.D.)-Syracuse University, 1989.

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Copy number	Status	Date due	Barcode
TERHAD	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG MEDIA-P. TUN SERI LANANG (ARAS 2)	mikrofis tesis QA76.9.V56 1989 (Browse shelf(Opens below))		1	Available		00000126916

Thesis (Ph.D.)-Syracuse University, 1989.

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