New algorithms for fault simulation and random pattern testing
Vinod Narayanan.
New algorithms for fault simulation and random pattern testing [microform] / by Vinod Narayanan. - Ann Arbor, Mich. : University Microfilms International, 1989. - 2 microfiches ; 11 X 15 cm.
Thesis (Ph.D.)-Syracuse University, 1989.
Computer algorithms.
Simulation methods.
Algorithms.
New algorithms for fault simulation and random pattern testing [microform] / by Vinod Narayanan. - Ann Arbor, Mich. : University Microfilms International, 1989. - 2 microfiches ; 11 X 15 cm.
Thesis (Ph.D.)-Syracuse University, 1989.
Computer algorithms.
Simulation methods.
Algorithms.