MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01242nam a2200301 a 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
981208s1975 xxua 00 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0471790206 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
UKM |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
QH212 |
| Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN) |
.E4S53 |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Physical aspects of electron microscopy and microbeam analysis / |
| Statement of responsibility, etc. |
edited by Benjamin M. Siegel, and Donald R. Beaman. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York : |
| Name of publisher, distributor, etc. |
Wiley, |
| Date of publication, distribution, etc. |
1975 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xiii, 474 pages. : |
| Other physical details |
illustrations. ; |
| Dimensions |
26 cm. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
'A Wiley biomedical-health publication.' |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron microscopes. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Microprobe analysis. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Microchemistry. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Siegel, Benjamin M. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Beaman, Donald Robert. |
| 711 2# - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Electron Microscopy Society of America. |
| 711 2# - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Microbeam Analysis Society. |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
|---|
| a |
.b11770594 |
| b |
2021-03-05 |
| c |
2019-11-12 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
AM |
| Suppress in OPAC |
No |
| Call number prefix |
QH212 .E4S53 |
| 914 ## - VTLS Number |
|---|
| VTLS Number |
vtls000183262 |
| 991 ## - LOCAL NOTE (NAMA FAKULTI/INSTITUT/PUSAT) |
|---|
| a |
Fakulti Sains Hayat |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) |
|---|
| Library |
PERPUSTAKAAN TUN SERI LANANG |
| Operator's initials, OID (RLIN) |
1999-05-08 |
| Cataloger's initials, CIN (RLIN) |
m |
| Material Type (Sierra) |
Printed Books |
| Language |
English |
| Country |
|
| -- |
0 |
| -- |
.b11770594 |
