Physical aspects of electron microscopy and microbeam analysis /
Physical aspects of electron microscopy and microbeam analysis /
edited by Benjamin M. Siegel, and Donald R. Beaman.
- New York : Wiley, 1975
- xiii, 474 pages. : illustrations. ; 26 cm.
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973. 'A Wiley biomedical-health publication.'
Includes bibliographical references and index.
0471790206
Electron microscopes.
Microprobe analysis.
Microchemistry.
Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973. 'A Wiley biomedical-health publication.'
Includes bibliographical references and index.
0471790206
Electron microscopes.
Microprobe analysis.
Microchemistry.