| 000 | 01114nam a2200301 a 4500 | ||
|---|---|---|---|
| 005 | 20250913132130.0 | ||
| 008 | 981208s1993 maua 001 0 eng | ||
| 010 | _a93-15447 | ||
| 020 |
_a079239352X _cRM325.95 |
||
| 039 | 9 |
_a201208270847 _bzabidah _y08-18-1999 _zload |
|
| 090 | _aTK7874.L334 | ||
| 090 |
_aTK7874 _b.L334 |
||
| 100 | 1 | _aLeblebici, Yusuf. | |
| 245 | 1 | 0 |
_aHot-carrier reliability of MOS VLSI circuits / _cby Yusuf Leblebici, Sung-Mo (Steve) Kang. |
| 260 |
_aBoston, Mass. : _bKluwer Academic Publishers, _c1993. |
||
| 300 |
_a212 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index. | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integrated _xDefects _xMathematical models. |
|
| 650 | 0 |
_aMetal oxide semiconductors _xReliability _xMathematical models. |
|
| 650 | 0 |
_aHot _xcarriers _xReliability _xMathematical models. |
|
| 700 | 1 |
_aKang, Sung-Mo, _d1945- |
|
| 907 |
_a.b10977879 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7874.L334 |
||
| 914 | _avtls000101580 | ||
| 991 | _aFakulti Sains dan Teknologi | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _gmau _y0 _z.b10977879 |
||
| 999 |
_c99615 _d99615 |
||