| 000 | 01033nam a2200277 a 4500 | ||
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| 005 | 20250913131303.0 | ||
| 007 | he amu bauz | ||
| 008 | 981208s1989 xxu b 000 0 eng | ||
| 039 | 9 |
_a200801152154 _brosma _y08-18-1999 _zload |
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| 090 | _amikrofis tesis TK7871.85.L43 1989 | ||
| 090 |
_amikrofis tesis TK7871.85 _b.L43 1989 |
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| 100 | 1 | _aLee, Jack Chung-Yeung | |
| 245 | 1 | 0 |
_aHigh-field reliability of MOS devices _h[microform] / _cJack Chung-Yeung Lee |
| 260 |
_aAnn Arbor, Mich. : _bUniversity Microfilms International, _c1989 |
||
| 300 |
_a2 microfiches ; _c11 x 15 cm. |
||
| 502 | _aThesis (Ph.D.) - University of California, 1988 | ||
| 650 | 0 | _aMetal oxide semiconductors | |
| 650 | 0 |
_aMetal oxide semidonductors _xField _xeffect transistor |
|
| 907 |
_a.b10950187 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c3 _n0 _kmikrofis tesis TK7871.85.L43 1989 |
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| 914 | _avtls000098733 | ||
| 990 | _ar | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10950187 |
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| 999 |
_c96849 _d96849 |
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