000 00943nam a2200277 a 4500
005 20250930095439.0
008 981208s1986 xxk 000 0 eng
039 9 _a201204190955
_blan
_y08-18-1999
_zload
040 _aUKM
090 _aQC176.83.H37 1986 4
090 _aQC176.83
_b.H37 1986 4
100 0 _aHasan Adli Alwi.
_937548
245 1 0 _aHigh resolution quartz crystal microbalance for thin film deposition measurements /
_cby Hasan Adli Alwi.
260 _aManchester :
_bUniversity of Manchester,
_c1986.
300 _a72 p. ;
_c30 cm.
500 _aThesis (MSc)-University of Manchester, 1986.
504 _ap. 71-73.
650 0 _aThin films
907 _a.b1094946x
_b2021-05-28
_c2019-11-12
942 _c3
_n0
_kQC176.83.H37 1986 4
914 _avtls000098657
991 _aFakulti Sains Fizik dan Gunaan
991 _aFakulti Kejuruteraan
998 _at
_b1999-05-08
_cm
_dx
_feng
_gxxk
_y0
_z.b1094946x
999 _c96777
_d96777