000 01463nam a2200385 a 4500
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006 m d
007 cr nn 008maaau
008 100623s2009 gw j eng d
020 _a9783540885887 (electronic bk.)
039 9 _y06-23-2010
_zmuhaimin
040 _aUKM
082 0 4 _a539.7222
_222
090 _aQC482.S3
_bX1 2009
245 0 0 _aX-ray and neutron reflectivity
_h[electronic resource] :
_bprinciples and applications /
_cedited by Jean Daillant, Alain Gibaud.
260 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2009.
300 _a342 p. :
_bill., digital ;
_c24 cm.
440 0 _aLecture notes in physics,
_x0075-8450 ;
_v770
650 0 _aX-rays
_xScattering.
650 0 _aNeutrons
_xScattering.
650 1 _aPhysics.
650 2 _aCharacterization and Evaluation of Materials.
650 2 _aSolid State Physics and Spectroscopy.
650 2 _aSurfaces and Interfaces, Thin Films.
700 1 _aDaillant, Jean.
700 1 _aGibaud, Alain.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
856 4 0 _uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=http://dx.doi.org/10.1007/978-3-540-88588-7
907 _a.b14736019
_b2024-06-26
_c2019-11-12
942 _n0
_kQC482.S3 X1 2009
914 _avtls003434479
998 _ae
_b2010-10-06
_cm
_dz
_feng
_ggw
_y0
_z.b14736019
999 _c677084
_d677084