000 01080nam a2200337 a 4500
005 20250913123049.0
008 981208s1992 xxua bi 00 eng
020 _a0306442620
039 9 _a200907151147
_bariff
_y08-18-1999
_zload
040 _aUKM
090 _aQC176.84.O7S65[00008027649]
090 _aQC176.84 .O7
_b.S65
100 1 _aSpence, John C. H.
245 1 0 _aElectron microdiffraction /
_cJ.C.H. Spence and J.M. Zuo
260 _aNew York :
_bPlenum Press,
_c1992
300 _axxiv, 358 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aThin films
_xOptical properties
650 0 _aCrystal optics
650 0 _aElectrons
_xDiffraction
650 0 _aSolid state physics
650 0 _aSolid state chemistry
700 1 _aZuo, J. M
907 _a.b10650568
_b2020-10-15
_c2019-11-12
942 _c01
_n0
_kQC176.84.O7S65[00008027649]
914 _avtls000067615
990 _amaa
991 _aFakulti Sains Fizik dan Gunaan
998 _at
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b10650568
999 _c66957
_d66957