| 000 | 01006nam a2200289 a 4500 | ||
|---|---|---|---|
| 005 | 20250913123048.0 | ||
| 008 | 981208s1982 us a 00 eng | ||
| 039 | 9 |
_a200908141143 _blaili _c200908141137 _dlaili _y08-18-1999 _zload |
|
| 040 | _aUKM | ||
| 090 | _aQH212.E4M87 | ||
| 090 |
_aQH212.E4 _bM87 |
||
| 100 | 1 |
_aMurr, Lawrence E. _q(Lawrence Eugene) |
|
| 245 | 1 | 0 |
_aElectron and ion microscopy and microanalysis : _bprinciples and applications / _cLawrence E. Murr |
| 260 |
_aNew York : _bMarcel Dekker, _c1982 |
||
| 300 |
_a793 p. : _bill. ; _c26 cm. |
||
| 440 |
_aOptical engineering ; _vv. 1 |
||
| 504 | _aIncludes bibliographical references and indexes | ||
| 650 | 0 | _aElectron microscopy | |
| 650 | 0 | _aField ion microscope | |
| 650 | 0 | _aMicroprobe analysis | |
| 907 |
_a.b10650295 _b2020-10-15 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQH212.E4M87 |
||
| 914 | _avtls000067588 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _g _y0 _z.b10650295 |
||
| 999 |
_c66930 _d66930 |
||