| 000 | 01355nam a2200361 i 4500 | ||
|---|---|---|---|
| 005 | 20250919130350.0 | ||
| 008 | 190225t2018 xxuda 001 0 eng d | ||
| 020 |
_a9781118456095 _qhardback _cRM463.68 |
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| 039 | 9 |
_a201902271440 _badibah _y02-25-2019 _zruzini |
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| 040 |
_aUKM _erda |
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| 090 | _aQH212.E4M538e 2018 9 | ||
| 090 |
_aQH212.E4 _bM538e 2018 9 |
||
| 100 | 1 |
_aMendis, Budhika G., _eauthor. |
|
| 245 | 1 | 0 |
_aElectron beam-specimen interactions and simulation methods in microscopy / _cBudhika G. Mendis. |
| 264 | 1 |
_aHoboken, NJ : _bJohn Wiley & Sons Ltd, _c2018. |
|
| 264 | 4 | _c©2018. | |
| 300 |
_ax, 279 pages : _billustrations ; _c2018. |
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| 336 |
_atext _2rdacontent |
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| 337 |
_aunmediated _2rdamedia |
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| 338 |
_avolume _2rdacarrier |
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| 490 | 1 | _aRoyal Microscopical Society - John Wiley series | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 2 | _aMicroscopy, Electron. | |
| 830 | 0 | _aRoyal Microscopical Society - John Wiley series | |
| 907 |
_a.b16688314 _b2019-11-12 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQH212.E4M538e 2018 9 |
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| 914 | _avtls003644239 | ||
| 990 | _aaa | ||
| 991 | _aJabatan Diagnostik, FSK, KKL | ||
| 998 |
_ad _b2019-12-02 _cm _da _feng _gxxu _y0 _z.b16688314 |
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| 999 |
_c636896 _d636896 |
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