000			01602cam a2200397 i 4500
005			20250919130327.0
008			190319s2019 xxua 000 0 eng
010			_a2018-027858
020			_a9781498783613 _qhardback _cRM562.33
039		9	_a201903211641 _bzakir _c201903191722 _dzakir _c201903191717 _dzakir _c201902120954 _dyah _y02-12-2019 _zyah
090			_aTA417.25.X733 3
090			_aTA417.25 _b.X733 3
245	0	0	_aX-ray diffraction imaging : _btechnology and applications / _cedited by Joel Greenberg, managing editor Krzysztof Iniewski.
264		1	_aBoca Raton : _bCRC Press, Taylor & Francis Group, _c[2019].
264		4	_c©2019.
300			_axxi, 255 pages : _billustrations ; _c24 cm.
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
490	0		_aTaylor and Francis series in devices, circuits, & systems
504			_aIncludes bibliographical references.
650		0	_aX-ray diffraction imaging.
650		0	_aRadiography, Industrial.
650		0	_aDetectors _xEquipment and supplies.
650		0	_aRefractometers.
700	1		_aGreenberg, Joel _q(Joel Alter), _eeditor.
700	1		_aIniewski, Krzysztof, _d1960- _eeditor.
907			_a.b16682919 _b2019-11-12 _c2019-11-12
942			_c01 _n0 _kTA417.25.X733 3
914			_avtls003643669
990			_azak.
991			_aFakulti Kejuruteraan dan Alam Bina.
998			_al _b2019-12-02 _cm _da _feng _gxxu _y0 _z.b16682919
999			_c636369 _d636369