000			02109cam a2200553Ii 4500
005			20250919130231.0
006			m o d
007			cr cnu|||unuuu
008			181219s2017 gw ob 001 0 eng d
020			_a9783527800308 _q(electronic bk. : oBook)
020			_a3527800301 _q(electronic bk. : oBook)
020			_a3527800050 _q(electronic bk. : ePDF)
020			_z9783527340392 _q(print)
020			_a9783527800056 _q(electronic bk.)
035			_a(OCoLC)970041648
035			_a(OCoLC)ocn970041648
039		9	_a201904121141 _bemilda _y12-19-2018 _zhafiz
040			_aNST _beng _erda _epn _cNST _dDG1 _dIDEBK _dNST
049			_aMAIN
050		4	_aT174.7
072		7	_aTEC _x009000 _2bisacsh
072		7	_aTEC _x035000 _2bisacsh
082	0	4	_a620/.5 _223
245	0	0	_aMetrology and standardization of nanotechnology : _bprotocols and industrial innovations / _cedited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
264		1	_aWeinheim, Germany : _bWiley-VCH, _c2017.
300			_a1 online resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
490	1		_aNanotechnology innovation & applications
504			_aIncludes bibliographical references and index.
588	0		_aOnline resource; title from PDF title page (John Wiley, viewed January 31, 2017).
650		0	_aNanotechnology.
650		0	_aMetrology.
655		4	_aElectronic books.
700	1		_aMansfield, Elisabeth, _eeditor.
700	1		_aKaiser, Debra L., _eeditor.
700	1		_aFujita, Daisuke, _eeditor.
700	1		_aVoorde, M. H. van de _q(Marcel H.), _eeditor.
773	0		_tWiley e-books
830		0	_aNanotechnology innovation & applications.
856	4	0	_uhttps://eresourcesptsl.ukm.remotexs.co/user/login?url=https://doi.org/10.1002/9783527800308 _zWiley Online Library
907			_a.b16667700 _b2022-10-06 _c2019-11-12
942			_n0
914			_avtls003642090
998			_ae _b2018-06-12 _cm _dz _feng _ggw _y0 _z.b16667700
999			_c634906 _d634906