000 01572cam a2200373 i 4500
005 20250919124900.0
008 181107s2009 ne a 001 0 eng
020 _a9780123738653
_qhardback
_cRM510.62
035 _a15718642
039 9 _a201904241406
_bzakir
_c201902140926
_dyah
_c201811071406
_dyah
_y11-07-2018
_zyah
040 _aUKM
_erda
090 _aTA1800.H85 3
090 0 0 _aTA1800
_b.H85 3
100 1 _aHui, Rongqing.
_eauthor.
245 1 0 _aFiber optic measurement techniques /
_cRongqing Hui, Maurice O'Sullivan.
264 1 _aAmsterdam :
_bElsevier/Academic Press,
_c[2009].
264 4 _c©2009.
300 _axvii, 652 pages :
_billustrations ;
_c24 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
504 _aIncludes bibliographical references and index.
505 0 _aFundamentals of optical devices -- Basic instrumentation for optical measurement -- Characterization of optical devices -- Optical fiber measurement -- Optical system performance measurements.
650 0 _aFiber optics
_xMeasurement.
700 1 _aO'Sullivan, Maurice S.
_q(Maurice Stephen),
_d1956-
907 _a.b16648249
_b2025-07-18
_c2019-11-12
942 _c01
_n0
_kTA1800.H85 3
914 _avtls003640084
990 _azak.
991 _aInstitut Kejuruteraan Mikro dan Nanoelektronik (IMEN)
998 _al
_b2018-07-11
_cm
_da
_feng
_gne
_y0
_z.b16648249
999 _c633055
_d633055