000 01684nam a2200409 i 4500
005 20250930141517.0
008 160627t2013 waua 101 0 eng d
020 _a9780819496706
_qpaperback
_qvolume 8820
_cRM299.90
039 9 _a201608021633
_basrul
_c201608021153
_dadibah
_c201607201550
_dadibah
_c201607201511
_dadibah
_y06-27-2016
_zrahah
040 _aUKM
_erda
090 _aQD921.N336 3
090 _aQD921
_b.N336 3
245 0 0 _aNanoepitaxy : materials and devices V :
_bproceedings of SPIE held in San Diego, California, United States, 25-27 August 2013 /
_ceditors, Nobuhiko P. Kobayashi [and three others].
246 3 _aProceedings of SPIE, Society of Photo-Optical Instrumentation Engineers.
264 4 _c©2013.
264 1 _aBellingham, Washington :
_bSPIE,
_c2013.
300 _a1 volume (various pagings) ;
_c27 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
504 _aIncludes bibliographical references and index.
650 0 _aEpitaxy
_vCongresses.
650 0 _aNanowires
_vCongresses.
650 0 _aNanostructured materials
_vCongresses.
_964113
650 0 _aSemiconductors
_xDesign and construction
_vCongresses.
700 1 _aKobayashi, Nobuhiko P.,
_eeditor.
700 1 _aTalin, A. Alec,
_eeditor.
700 1 _aDavydov, Albert V.,
_eeditor.
907 _a.b1634571x
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kQD921.N336 3
914 _avtls003608469
990 _aaa
991 _aInstitut Penyelidikan Tenaga Solar (SERI)
998 _al
_b2016-01-06
_cm
_da
_feng
_gwau
_y0
_z.b1634571x
999 _c611901
_d611901