000 01377nam a2200349 i 4500
005 20250919011711.0
008 160405t2013 nyuao b 001 0 eng
010 _a2013-029197
020 _a9781628087253
_qpaperback
_cRM197.10
039 9 _a201606161024
_bhamka
_c201606161021
_dhamka
_c201606151140
_dhamka
_c201605301058
_dzabidah
_y04-05-2016
_zzabidah
040 _aDLC
_beng
_cDLC
_erda
_dDLC
_dUKM
_erda
090 _aQC793.5.N4628N488
090 _aQC793.5.N4628
_bN488
245 0 0 _aNeutron diffraction :
_bprinciples, instrumentation and applications /
_cXinzhe Jin, editor.
264 1 _aNew York :
_bNovinka,
_c[2013].
264 4 _c©2013.
300 _a79 pages :
_billustrations (some color) ;
_c23 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
504 _aIncludes bibliographical references and index.
650 0 _aNeutrons
_xDiffraction.
700 1 _aJin, Xinzhe,
_eeditor.
907 _a.b16302151
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kQC793.5.N4628N488
914 _avtls003603584
990 _ahamka
991 _aFakulti Sains dan Teknologi
998 _at
_b2016-05-04
_cm
_da
_feng
_gnyu
_y0
_z.b16302151
999 _c607771
_d607771