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| 005 | 20250913120704.0 | ||
| 008 | 981208s1976 xxu 00| 0 eng | ||
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| 090 | _aTN706.B47 1976 4mikrofis | ||
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_aTN706 _b.B47 1976 |
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| 100 | 1 |
_aBerthold, John William, III, _d1945- |
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_aDimensional stability of low expansivity materials (microform) : _btime dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics / _cby John William Berthold III |
| 260 |
_aAnn Arbor, Mich. : _bUniversity Microfilms International , _c1976 |
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| 300 | _a1 microfiche ; 11 x 15 cm. | ||
| 502 | _aThesis (Ph.D.)-University of Arizona, 1976 | ||
| 650 | 0 |
_aSteel _xElectrometallurgy |
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| 650 | 0 |
_aSteel _xElectric properties |
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_a.b10563477 _b2021-05-28 _c2019-11-12 |
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_c3 _n0 _kTN706.B47 1976 4mikrofis |
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| 990 | _aiz | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
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_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10563477 |
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