000 01087nam a2200265 a 4500
005 20250913120704.0
008 981208s1976 xxu 00| 0 eng
039 9 _a200812011613
_bruzita
_y08-18-1999
_zload
090 _aTN706.B47 1976 4mikrofis
090 _aTN706
_b.B47 1976
100 1 _aBerthold, John William, III,
_d1945-
245 1 0 _aDimensional stability of low expansivity materials (microform) :
_btime dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics /
_cby John William Berthold III
260 _aAnn Arbor, Mich. :
_bUniversity Microfilms International ,
_c1976
300 _a1 microfiche ; 11 x 15 cm.
502 _aThesis (Ph.D.)-University of Arizona, 1976
650 0 _aSteel
_xElectrometallurgy
650 0 _aSteel
_xElectric properties
907 _a.b10563477
_b2021-05-28
_c2019-11-12
942 _c3
_n0
_kTN706.B47 1976 4mikrofis
914 _avtls000058622
990 _aiz
991 _aFakulti Sains Fizik dan Gunaan
998 _at
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b10563477
999 _c58265
_d58265