| 000 | 00869nam a2200265 a 4500 | ||
|---|---|---|---|
| 005 | 20250913120654.0 | ||
| 008 | 981208s1993 xxu 00 eng | ||
| 010 | _a93-13739 | ||
| 020 |
_a0442006438 _cRM171.03 |
||
| 039 | 9 |
_a200809190952 _bnorsiah _y08-18-1999 _zload |
|
| 090 | _aTK7874.H533 | ||
| 090 |
_aTK7874 _b.H533 |
||
| 100 | 1 | _aHnatek, Eugene R. | |
| 245 | 1 | 0 |
_aDigital integrated circuit testing from a quality perspective / _cEugene R. Hnatek |
| 260 |
_aNew York : _bVan Nostrand Reinhold, _c1993 |
||
| 300 |
_a179 p. : _bill. ; _c23 cm. |
||
| 650 |
_aDigital integrated circuits _xTesting _xQuality control |
||
| 907 |
_a.b1056116x _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kTK7874.H533 |
||
| 914 | _avtls000058381 | ||
| 990 | _awan | ||
| 991 | _aFakulti Kejuruteraan | ||
| 998 |
_al _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b1056116x |
||
| 999 |
_c58034 _d58034 |
||