000			01549nam a2200349 a 4500
005			20250913120645.0
008			981208s1978 ne a 001 0 eng
010			_a78-022081
020			_a0444851305
039		9	_a200812301550 _badnan _c200312311512 _dtrainer _y08-18-1999 _zload
090			_aTA417.23.D54 1978
090			_aTA417.23 _b.D54 1978
245	0	0	_aDiffraction and imaging techniques in material science / _ceditors, S. Amelinckx, R. Gevers, J. Van Landuyt
250			_a2d, rev. ed.
260			_aAmsterdam : _bNorth-Holland Publishing Company, _c1978
300			_a2 v. (xvii, 847 p., 1 fold. leaf of plates) : _bill. ; _c23 cm.
500			_aComprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science
504			_aIncludes bibliographical references and indexes
505		0	_av. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques
650		0	_aElectron microscopy _vCongresses
650		0	_aElectrons _xDiffraction _vCongresses
650		0	_aImaging systems _vCongresses
650		0	_aMaterials _xMicroscopy
700	1		_aAmelinckx, Severin
700	1		_aGevers, R
907			_a.b10558810 _b2021-05-28 _c2019-11-12
942			_c01 _n0 _kTA417.23.D54 1978
914			_avtls000058141
991			_aF S Kemasyarakatan dan Kemanusiaan
998			_al _b1999-05-08 _cm _da _feng _gne _y0 _z.b10558810
999			_c57802 _d57802