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020 _a9789814571937
_cRM451.26
020 _a9814571938
039 9 _a201408121138
_bhayat
_c201408120921
_dhayat
_c201407141040
_datika
_c201407071147
_datika
_y04-08-2014
_zhamudah
040 _aBTCTA
_beng
_erda
_cBTCTA
_dCDX
_dYDXCP
_dSINLB
_dUKM
090 _aTA169.R458 3
090 _aTA169
_b.R458 3
245 0 0 _aReliability modeling with applications :
_bessays in honor of Professor Toshio Nakagawa on his 70th birthday /
_ceditors : Syouji Nakamura, Cun Hua Qian, Mingchih Chen.
264 1 _aSingapore :
_bWorld Scientific Pub. Co.,
_c[2014].
264 4 _c2014.
300 _axiv, 364 pages :
_billustrations ;
_c24 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
504 _aIncludes bibliographical references.
650 0 _aReliability (Engineering).
700 1 _aNakamura, Syouji,
_eeditor.
700 1 _aQian, Cun Hua,
_eeditor.
700 1 _aChen, Mingchih,
_eeditor.
907 _a.b15871393
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kTA169.R458 3
914 _avtls003556140
990 _anab
991 _aFakulti Kejuruteraan dan Alam Bina
998 _al
_b2014-08-04
_cm
_da
_feng
_gsi
_y0
_z.b15871393
999 _c566924
_d566924