000 01397nam a2200349Ia 4500
005 20250918232852.0
008 140127s2013 gw a b 001 0 eng d
020 _a9783642273803
_cRM747.96
020 _a3642273807
039 9 _a201402071613
_brosli
_y01-27-2014
_zmazarita
040 _aBTCTA
_beng
_cBTCTA
_dUKMGB
_dYDXCP
_dOHX
_dEUN
_dBWX
_dABC
_dOCLCF
_dAFU
_dUKM
090 _aQC454.P48H635
090 _aQC454.P48
_bH635
100 1 _aHofmann, S.
_q(Siegfried).
245 1 0 _aAuger- and X-ray photoelectron spectroscopy in materials science :
_ba user-oriented guide /
_cSiegfried Hofmann.
260 _aHeidelberg :
_bSpringer Verlag,
_c2013.
300 _axix, 528 p. :
_bill. ;
_c24 cm.
490 1 _aSpringer series in surface sciences ;
_v49
504 _aIncludes bibliographical references and index.
650 0 _aX-ray photoelectron spectroscopy.
650 0 _aAuger electron spectroscopy.
650 0 _aAuger effect.
830 0 _aSpringer series in surface sciences ;
_v49.
907 _a.b15813447
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kQC454.P48H635
914 _avtls003549590
990 _ark4
991 _aFakulti Sains dan Teknologi
998 _at
_b2014-01-01
_cm
_da
_feng
_ggw
_y0
_z.b15813447
999 _c561448
_d561448