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008 981208s1982 xxu 00| 0 eng
039 9 _a200807111216
_bruzita
_y08-18-1999
_zload
090 _aTK7874.75.O54 1982 4mikrofis
090 _aTK7874.75
_bO54 1982
100 1 _aOklobdzija, Vojin G.
245 1 0 _aDesign for testability of VLSI structures through the use of circuit techniques (microform) /
_cVojin G. Oklobdzija
260 _aAnn Arbor, Mich. :
_bUniversity Microfilms International ,
_c1982
300 _a2 microfiches ; 11 x 15 cm.
502 _aThesis (Ph.D.)-University of California, 1982
650 0 _aIntegrated circuits
_xVery large scale integration
_xTesting
907 _a.b10525531
_b2021-05-28
_c2019-11-12
942 _c3
_n0
_kTK7874.75.O54 1982 4mikrofis
914 _avtls000054701
990 _aiz
991 _aFakulti Sains Fizik dan Gunaan
998 _at
_b1999-05-08
_cm
_da
_feng
_gxxu
_y0
_z.b10525531
999 _c54483
_d54483