000 01232nam a2200265 a 4500
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008 981208c19909999ne 00 eng
039 9 _a200806191141
_bzarina
_y08-18-1999
_zload
090 _aQC611.6.D4I583 1989[00008027923]
090 _aQC611.6.D4
_bI583 1989
110 2 _aInternational Conference on the Science and Technology of Defect Control in Semiconductors
_n(1989 : Yokohama-shi, Japan)
245 1 0 _aDefect control in semiconductors :
_bproceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 /
_cedited by K. Sumino
260 _aAmsterdam :
_bNorth-Holland,
_c1990
300 _av.: ill. ;
_c28 cm.
504 _aIncludes bibliographical references and indexes
650 0 _aSemiconductors
_xDefects
_vCongresses
650 0 _aMaterials
_xDefects
_vCongresses
710 1 _aSumino, K.
_q(Kojmi),
_d1931-
907 _a.b10515239
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQC611.6.D4I583 1989[00008027923]
914 _avtls000053640
991 _aFakulti Sains Fizik dan Gunaan
998 _at
_b1999-05-08
_cm
_da
_feng
_gne
_y0
_z.b10515239
999 _c53458
_d53458