| 000 | 01019nam a2200265 a 4500 | ||
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| 005 | 20250913115939.0 | ||
| 007 | he am baa | ||
| 008 | 981208s1985 xxu bm 00 eng | ||
| 039 | 9 |
_a200708161716 _brashid _y08-18-1999 _zload |
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| 090 | _amikrofis tesis QC611.6.D4S96 1985 | ||
| 090 |
_amikrofis tesis QC611.6.D4 _bS96 1985 |
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| 100 | 1 | _aSundaram, Lalgudi M. G. | |
| 245 | 1 | 0 |
_aDefect characterization in semiconductors by deep level transient spectroscopy _h[microform] / _cby Lalgudi M. G. Sundaram |
| 260 |
_aAnn Arbor, Mich. : _bUniversity Microfilms International , _c1985 |
||
| 300 |
_a3 microfiches ; _c11 x 15 cm. |
||
| 502 | _aThesis (Ph.D.) - Rensselaer Polytechnic Institute, 1984 | ||
| 650 | 0 |
_aSemiconductors _xDefects |
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| 907 |
_a.b10515227 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c3 _n0 _kmikrofis tesis QC611.6.D4S96 1985 |
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| 914 | _avtls000053639 | ||
| 990 | _ar | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10515227 |
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| 999 |
_c53457 _d53457 |
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