| 000 | 00900nam a2200289 a 4500 | ||
|---|---|---|---|
| 005 | 20250913115939.0 | ||
| 008 | 981208s1975 xxu 00 0 eng | ||
| 020 | _a0412137607 | ||
| 039 | 9 |
_a200806191118 _bzarina _y08-18-1999 _zload |
|
| 090 | _aQD921.L67 | ||
| 090 |
_aQD921 _b.L67 |
||
| 100 | 1 | _aLoretto, M. H | |
| 245 | 1 | 0 |
_aDefect analysis in electron microscopy / _cM. H. Loretto and R. E. Smallman |
| 260 |
_aLondon : _bChapman & Hall, _c1975 |
||
| 300 |
_aix, 134 p. : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index | ||
| 504 | _aBibliography: p. 131 | ||
| 650 | 0 |
_aCrystals _xDefects |
|
| 650 | 0 | _aElectron microscopy | |
| 700 | 1 | _aSmallman, R. E | |
| 907 |
_a.b10515203 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c01 _n0 _kQD921.L67 |
||
| 914 | _avtls000053637 | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10515203 |
||
| 999 |
_c53455 _d53455 |
||