000 01214nam a22003257a 4500
005 20250930133958.0
008 121029s2012 nyua b 001 0 eng d
020 _a9781461418115 (hbk.)
_cRM372.41
039 9 _a201211140951
_bzabidah
_c201211021122
_drosli
_y10-29-2012
_zfarid
040 _dUKM
090 _aTK7874.H3956 3
090 _aTK7874
_b.H3956 3
100 1 _aHe, Ming.
245 1 0 _aMetal-dielectric interfaces in gigascale electronics :
_bthermal and electrical stability /
_cMing He, Toh-Ming Lu.
260 _aNew York :
_bSpringer,
_c2012.
300 _axi, 149 p. :
_bill. (some col.) ;
_c24 cm.
490 1 _aSpringer series in materials science ;
_vv. 157.
504 _aIncludes bibliographical references and index.
650 0 _aMicroelectronics
_xMaterials
_960417
650 0 _aInterfaces (Physical sciences)
700 1 _aLu, T.-M.
_q(Toh-Ming),
_d1943-
830 0 _aSpringer series in materials science ;
_vv. 157.
907 _a.b15512939
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kTK7874.H3956 3
914 _avtls003516886
990 _ark4
991 _aFakulti Kejuruteraan dan Alam Bina
998 _al
_b2012-03-10
_cm
_da
_feng
_gnyu
_y0
_z.b15512939
999 _c534380
_d534380