| 000 | 00812nam a2200265 a 4500 | ||
|---|---|---|---|
| 005 | 20250913115937.0 | ||
| 008 | 981208s1982 en a bi 00 eng d | ||
| 020 | _a0852745168 | ||
| 039 | 9 |
_a200904161135 _bariff _y08-18-1999 _zload |
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| 040 | _aUKM | ||
| 090 | _aQC611.8.D5J3[00008040819] | ||
| 090 |
_aQC611.8.D5 _bJ3 |
||
| 100 | 1 | _aJaros, M. | |
| 245 | 1 | 0 |
_aDeep levels in semiconductors / _cM. Jaros |
| 260 |
_aBristol : _bHilger, _c1982 |
||
| 300 |
_axi, 302 p. : _bill. ; _c23 cm. |
||
| 504 | _aIncludes bibliographical refrences and index | ||
| 650 | 0 |
_aSemiconductors _xDefects |
|
| 907 |
_a.b10514788 _b2020-10-12 _c2019-11-12 |
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| 942 |
_c01 _n0 _kQC611.8.D5J3[00008040819] |
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| 914 | _avtls000053594 | ||
| 990 | _amaa | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _g _y0 _z.b10514788 |
||
| 999 |
_c53413 _d53413 |
||