| 000 | 01000nam a2200301 a 4500 | ||
|---|---|---|---|
| 005 | 20250913115937.0 | ||
| 008 | 981208s1989 xxu 00 eng | ||
| 035 | _a722621 | ||
| 039 | 9 |
_y08-18-1999 _zload |
|
| 090 | _aTK7871.85.W44 1989 4mikrofis | ||
| 090 | _aTK7871.85 | ||
| 100 | 1 | _aWei-I, Lee | |
| 245 | 1 | 0 |
_aDeep level transient spectroscopy characterization of semiconductors ( microform) _cby Wei-I Lee |
| 260 |
_aAnn Arbor, Mich. _bUniversity Microfilms International _c1989 |
||
| 300 | _a3 microfiches ; 11 x 15 cm. | ||
| 502 | _aThesis (Ph.D.) - Rensselaer Polytechnic Institute, 1988 | ||
| 590 | _a1 | ||
| 650 |
_aSemiconductors _xDefects |
||
| 907 |
_a.b10514764 _b2021-05-28 _c2019-11-12 |
||
| 942 |
_c3 _n0 _kTK7871.85.W44 1989 4mikrofis |
||
| 914 | _avtls000053592 | ||
| 990 | _ar | ||
| 991 | _aFakulti Sains Fizik dan Gunaan | ||
| 991 | _aFakulti Kejuruteraan | ||
| 998 |
_at _b1999-05-08 _cm _da _feng _gxxu _y0 _z.b10514764 |
||
| 999 |
_c53411 _d53411 |
||