000 01235nam a2200325 a 4500
005 20250918170833.0
008 121018s2011 gw a b 001 0 eng
020 _a9783527320479 (hbk.)
_cRM620.00
039 9 _a201304231139
_brosli
_c201303261629
_drasyilla
_y10-18-2012
_zbinar
040 _aDLC
_cDLC
_dDLC
_dUKM
090 _aQC176.84.S93S837 2011
090 _aQC176.84.S93
_bS837 2011
245 0 0 _aSurface and thin film analysis :
_ba compendium of principles, instrumentation, and applications /
_cedited by Gernot Friedbacher and Henning Bubert.
250 _a2nd, completely rev. and enlarged ed.
260 _aWeinheim :
_bWiley-VCH,
_c2011.
300 _axxiv, 533 p. :
_bill. (some col.) ;
_c25 cm.
504 _aIncludes bibliographical references and index.
650 0 _aThin films
_xSurfaces
_xAnalysis.
650 0 _aElectron spectroscopy.
650 0 _aSpectrum analysis.
700 1 _aFriedbacher, Gernot.
700 1 _aBubert, H.
_q(Henning).
907 _a.b15505364
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kQC176.84.S93S837 2011
914 _avtls003516092
990 _ark4
991 _aFakulti Sains dan Teknologi
998 _at
_b2012-05-10
_cm
_da
_feng
_ggw
_y0
_z.b15505364
999 _c533651
_d533651