000 01113nam a2200325 a 4500
005 20250918164835.0
008 120712s2012 nyua 001 0 eng
020 _a9780073529578
039 9 _a201208031703
_bzaina
_c201208031702
_dzaina
_c201207122101
_didah
_y07-12-2012
_zidah
040 _aDLC
_cDLC
_dUKM
090 _aTK454.H4 2012 3
090 _aTK454
_b.H4 2012 3
100 1 _aHayt, William Hart,
_d1920-
245 1 0 _aEngineering circuit analysis /
_cWilliam H. Hayt, Jr., Jack E. Kemmerly, Steven M. Durbin.
250 _a8th ed.
260 _aNew York :
_bMcGraw-Hill,
_c2012.
300 _axxi, 852 p. :
_bill. ;
_c26 cm.
504 _aIncludes index.
650 0 _aElectric circuit analysis.
650 0 _aElectric network analysis.
700 1 _aKemmerly, Jack E.
_q(Jack Ellsworth),
_d1924-
700 1 _aDurbin, Steven M.
907 _a.b15428552
_b2019-11-12
_c2019-11-12
942 _c01
_n0
_kTK454.H4 2012 3
914 _avtls003508033
990 _azsz
991 _aFakulti Kejuruteraan dan Alam Bina
998 _al
_b2012-12-07
_cm
_da
_feng
_gnyu
_y0
_z.b15428552
999 _c526237
_d526237