000 00996nam a2200313 a 4500
005 20250918150531.0
008 120208s2010 nyu 001 0 eng
020 _a9781606500446
_cRM265.18
039 9 _a201202231651
_bbaizura
_y02-08-2012
_zidah
040 _aUKM
090 _aQC176.9.O73C485 3
090 _aQC176.9.O73
_bC485
245 0 0 _aCharacterization of organic thin films /
_cAbraham Ulman [editors].
260 _aNew York :
_bMomentum Press,
_c2010.
300 _axvii, 276 p. :
_bill. ;
_c23 cm.
490 1 _aMaterial characterization series.
504 _aIncludes index.
650 0 _aOrganic compounds.
650 0 _aThin films.
700 1 _aUlman, Abraham,
_d1946-
830 0 _aMaterial characterization series.
907 _a.b1523745x
_b2021-05-28
_c2019-11-12
942 _c01
_n0
_kQC176.9.O73C485 3
914 _avtls003487305
990 _anm
991 _aInstitut Sel Fuel
998 _at
_b2012-08-02
_cm
_da
_feng
_gnyu
_y0
_z.b1523745x
999 _c507843
_d507843