000 01203nam a2200337 a 4500
005 20250930132023.0
008 110525s2009 my da m 000 0 may
039 9 _a201212182038
_byah
_c201106100944
_dfati
_y05-25-2011
_znorehan
040 _aUKM
090 _aTA417.5.M848 2009 3tesis
090 _aTA417.5
_b.M848 2009 3
100 0 _aMohd Zaki Umar
245 1 0 _aPembangunan teknik termografi terdenyut untuk pengesanan kecacatan sub-permukaan bakelit /
_cMohd Zaki bin Umar
260 _c2009
300 _axvi, 124 p. :
_bcharts, ill. ;
_c30 cm.
502 _aTesis (Sarjana Sains) - Universiti Kebangsaan Malaysia, 2009
504 _aRujukan : p. 81-85
610 2 0 _aUniversiti Kebangsaan Malaysia
_xDissertations
_962865
650 0 _aNondestructive testing
650 0 _aThermography
650 0 _aInfrared testing
650 0 _aBakelite
_xTesting
650 0 _aDissertations, Academic
_zMalaysia
_962866
907 _a.b15046175
_b2025-07-18
_c2019-11-12
942 _c3
_n0
_kTA417.5.M848 2009 3tesis
914 _avtls003467067
990 _ank/fka
991 _aFakulti Kejuruteraan dan Alam Bina
998 _al
_b2011-12-05
_cm
_dx
_fmay
_gmy
_y0
_z.b15046175
999 _c489308
_d489308