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|---|---|---|---|
| 005 | 20250918140626.0 | ||
| 008 | 110504s2010 nyua b 001 0 eng d | ||
| 020 |
_a9781608761579 _cRM181.13 |
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| 020 | _a1608761576 | ||
| 039 | 9 |
_a201210040920 _byah _c201112200923 _dzaina _c201111251123 _drasyilla _y05-04-2011 _zmazarita |
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| 040 | _aUKM | ||
| 090 | _aTA417.2.N658 3 | ||
| 090 |
_aTA417.2 _b.N658 |
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| 245 | 0 | 0 |
_aNondestructive testing : _bmethods, analyses and applications / _cEarl N. Mallory, editor |
| 260 |
_aNew York : _bNova Science Publishers, _c2010 |
||
| 300 |
_ax, 204 p. : _bill. (some col.) ; _c23 cm. |
||
| 490 | 1 | _aMechanical engineering theory and applications | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aNondestructive testing | |
| 650 | 0 |
_aNondestructive testing _xMathematical models |
|
| 700 | 1 | _aMallory, Earl N. | |
| 830 | 0 | _aMechanical engineering theory and applications | |
| 907 |
_a.b15027752 _b2021-05-28 _c2019-11-12 |
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| 942 |
_c01 _n0 _kTA417.2.N658 3 |
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| 914 | _avtls003465069 | ||
| 990 | _azsz | ||
| 991 | _aInstitut Kejuruteraan Mikro dan Nanoelektronik (IMEN) - Pasca | ||
| 998 |
_al _b2011-04-05 _cm _da _feng _gnyu _y0 _z.b15027752 |
||
| 999 |
_c487490 _d487490 |
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